COMPONENT NAME AND QUANTITY | 8 SEMICONDUCTOR DEVICE DIODE |
SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 75.0 MAXIMUM BREAKDOWN VOLTAGE, DC ALL SEMICONDUCTOR DEVICE DIODE |
CURRENT RATING PER CHARACTERISTIC | 200.00 MILLIAMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE ALL SEMICONDUCTOR DEVICE DIODE |
POWER RATING PER CHARACTERISTIC | 600.0 MILLIWATTS MAXIMUM TOTAL POWER DISSIPATION ALL SEMICONDUCTOR DEVICE DIODE |
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 175.0 DEG CELSIUS AMBIENT AIR |
INCLOSURE MATERIAL | GLASS |
MOUNTING METHOD | TERMINAL |
TERMINAL LENGTH | 0.260 INCHES MAXIMUM |
TERMINAL TYPE AND QUANTITY | 16 PIN |
OVERALL LENGTH | 0.785 INCHES MAXIMUM |
OVERALL HEIGHT | 0.200 INCHES MAXIMUM |
OVERALL WIDTH | 0.310 INCHES MAXIMUM |
FEATURES PROVIDED | HERMETICALLY SEALED CASE AND |
| QUALITY ASSURANCE LEVEL TXV |
SPECIAL FEATURES | ALL SEMICONDUCTOR DEVICE DIODE JUNCTION PATTERN ARRANGEMENT: PN |
TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). |
SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/474 GOVERNMENT SPECIFICATION |
PRECIOUS MATERIAL | GOLD |
PRECIOUS MATERIAL AND LOCATION | TERMINALS EXTERNAL SURFACE GOLD |
SPEC/STD CONTROLLING DATA | |
MANUFACTURERS CODE | 81349 |
DEFINITIVE GOVERNMENT SPEC/STD REFERENCE | JANTXV1N6101 |
NON-DEFINITIVE GOVERNMENT SPEC/STD REFERENCE | MIL-PRF-19500/474 |