| BODY STYLE | CHIP TYPE |
| RELIABILITY INDICATOR | ESTABLISHED |
| INSULATION RESISTANCE AT REFERENCE TEMP | 1000000.0 MEGOHMS |
| BODY LENGTH | 0.040 INCHES MINIMUM AND 0.070 INCHES MAXIMUM |
| QUALITY FACTOR AT REFERENCE TEMP | 8000.0000 |
| DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT | 0.0500 |
| TERMINAL TYPE AND QUANTITY | 2 BONDING PAD |
| TERMINAL LENGTH | 0.005 INCHES MINIMUM AND 0.020 INCHES MAXIMUM |
| TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS | -20.0/+20.0 SINGLE SECTION |
| TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS | 90.0 SINGLE SECTION |
| CAPACITANCE VALUE PER SECTION | 27.000 PICOFARADS SINGLE SECTION |
| INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP | 100000.0 MEGOHMS |
| NONDERATED OPERATING TEMP | -55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| BODY WIDTH | 0.040 INCHES MINIMUM AND 0.070 INCHES MAXIMUM |
| SPECIFICATION/STANDARD DATA | 81349-MIL-C-55681/4 GOVERNMENT SPECIFICATION |
| TEST DATA DOCUMENT | 81349-MIL-C-55681 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). |
| TERMINAL SURFACE TREATMENT | PALLADIUM AND SILVER |
| BODY HEIGHT | 0.020 INCHES MINIMUM AND 0.057 INCHES MAXIMUM |
| CASE MATERIAL | CERAMIC OR GLASS |
| SCHEMATIC DIAGRAM DESIGNATOR | NO COMMON OR GROUNDED ELECTRODE(S) |
| TOLERANCE RANGE PER SECTION | -1.00 TO 1.00 PERCENT SINGLE SECTION |
| PRECIOUS MATERIAL AND LOCATION | TERMINAL SURFACES PALLADIUM AND TERMINAL SURFACES SILVER |
| RELIABILITY FAILURE RATE LEVEL IN PERCENT | 0.0100 |
| NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION | 50.0 DC SINGLE SECTION |